sexta-feira, 11 de novembro de 2011

Análise laboratorial do património cultural

A revista Microscopy and Microanalysis, volume 17, n.º 5, de 2011, acabada de publicar, tem como tema: Analysis of Cultural Heritage.

Está aqui (acesso condicionado).

Índice:

  • Clive Walker, Ineke Joosten, Introduction: Analysis of Cultural Heritage, p. 655-655
  • Corrie J.G. van Hoek, Michiel de Roo, Grishja van der Veer, Sieger R. van der Laan, A SEM-EDS Study of Cultural Heritage Objects with Interpretation of Constituents and Their Distribution Using PARC Data Analysis, pp. 656-660
  • Silvia Calusi, The External Ion Microbeam of the LABEC Laboratory in Florence: Some Applications to Cultural Heritage, pp. 661-666
  • Myriam Eveno, Brice Moignard, Jacques Castaing, Portable Apparatus for In Situ X-Ray Diffraction and Fluorescence Analyses of Artworks, pp. 667-673
  • Veerle Van der Linden, Eva Meesdom, Annemie Devos, Rita Van Dooren, Hans Nieuwdorp, Elsje Janssen, Sophie Balace, Bart Vekemans, Laszlo Vincze, Koen Janssens, PXRF, µ-XRF, Vacuum µ-XRF, and EPMA Analysis of Email Champlevé Objects Present in Belgian Museums, pp. 674-685
  • Ralph Haswell, Leslie Carlyle, Kees T.J. Mensch, Quantitative Determination of van Gogh's Painting Grounds Using SEM/EDX, pp. 686-690
  • Claudia Daffara, Raffaella Fontana, Multispectral Infrared Reflectography to Differentiate Features in Paintings, pp. 691-695
  • Katrien Keune, Annelies van Loon, Jaap J. Boon, SEM Backscattered-Electron Images of Paint Cross Sections as Information Source for the Presence of the Lead White Pigment and Lead-Related Degradation and Migration Phenomena in Oil Paintings, pp. 696-701
  • S. Valadas, A. Candeias, J. Mirão, D. Tavares, J. Coroado, Rolf Simon, A. S. Silva, M. Gil, A. Guilherme, M. L. Carvalho, Study of Mural Paintings Using In Situ XRF, Confocal Synchrotron-µ-XRF, µ-XRD, Optical Microscopy, and SEM-EDS—The Case of the Frescoes from Misericordia Church of Odemira, pp. 702-709

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